The Sophisticated Analytical Instrument Facility (SAIF) was established at the Indian Institute of Technology Madras, by the Department of Science and Technology (DST), as the first such regional facility in 1974. The facility acquires and maintains sophisticated electronic instruments and equipment, and provides relevant service to the scientific community for advanced research, at nominal charges. The facility has grown into a major centre for spectral measurements, structure determination and materials characterization.
Head of the Facility
Bhattacharya, S.S., Ph.D.
Tel (O) : 22574935
Babu Varghese, Ph.D.
Murugesan R., Ph.D.
|500 MHz FT NMR Spectrometer||BRUKER AV III|
|X-ray Fluorescence spectrometer (WD XRF)||Bruker S4 Pioneer|
|ICP-OES||Perkin Elmer Optima 5300 DV|
|GC-MS Spectrometer||JEOL GC Mate|
|Spectro Fluorometer||Jobin Yvon Fluorimeter|
|LIFE TIME SYSTEM||FLUOROMAX|
|IR Spectrophotometer 450-4000 cm-1||PE FT IR|
|UV-VIS-NIR spectrometer||Cary 5E|
|Mossbauer Spectrometer||Nucleonix Model|
|Single Crystal X-Ray Diffractometers||Enraf Nonius CAD4-MV31
Bruker Kappa APEXII
|HR-SEM||FEI Quanta FEG 200 High Resolution Scanning Electron Microscope|
|Vibrating Sample Magnetometer||Lakeshore VSM 7410|
|Thermal Analyzer||Netzsch TGA/DTA/DSC|
As SAIF is a service-oriented centre, consultancy services have been provided to various industries. SAIF scientists, in addition to analysis service, have taken up consultancy work for the industry to provide specific analytical service of non-routine nature. Also, on specific request, SAIF can provide training for operation and maintenance of sophisticated instruments at other institutions.