Publications

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2008
Bhaduri B, Mohan KN, Kothiyal MP. A comparative study of phase shifting algorithms in Digital Speckle Pattern Interferometry. Optik,. 2008;119:147-152.
Bhaduri B, Mohan KN, Kothiyal MP. Digital speckle pattern interferometry (DSPI) using spatial phase shifting: influence of intensity. J. Modern Optics. 2008;55:861-876.
Kumar PU, Bhaduri B, Mohan KN, Kothiyal MP. Microscopic TV holography for MEMS deflection and surface profile. Optics and Lasers in Engineering. 2008;46:687-694.
2007
Bhaduri B, Mohan KN, Kothiyal MP. (1,N) spatial phase shifting technique in DSPI and DS for NDE. Optical Engineering. 2007;46:051009-1-051009-7.
Bhaduri B, Kothiyal MP, Mohan KN. Curvature measurement using three-aperture digital shearography and fast Fourier transform method. Optics and Lasers in Engineering. 2007;45:1001-1014.
Sathiyamoorthy K, Vijayan C, Kothiyal MP. Design of a low power optical limiter based on a new nanocomposite material incorporating silica- encapsulated phthalocyanine in Nafion. Journal of Physics D. 2007;40:6121.
Bhaduri B, Kothiyal MP, Mohan KN. Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting. Optics Communication. 2007;272:9-14.
Debnath SK, Kothiyal MP. Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer. Applied Optics. 2007;46:5103-5109.
Sathiyamoorthy K, Vijayan C, Kothiyal MP. Photoacoustic investigation of aggregation effects in metal substituted tetra-phenylporphyrins. Material letters. 2007;61:4156.
Sathiyamoorthy K, Vijayan C, Kothiyal MP. Simple technique for obtaining photoacoustic spectra corrected for the spectral variation of the source in single scan. Review of Scintific Instruments. 2007;78:043102.
Bhaduri B, Mohan KN, Kothiyal MP. Simultaneous measurement of out-of-plane displacement and slope using multi-aperture DSPI system and fast Fourier transform. Applied Optics. 2007;46:5880-5886.
2006
Debnath SK, Kothiyal MP, Schmit J, Hariharan P. Spectrally resolved phase-shifting interferometry of transparent thin-films: sensitivity of thicknes measurements. Applied Optics. 2006;45:8636–8640.
Debnath SK, Kothiyal MP, Schmit J, Hariharan P. Spectrally resolved white–light phase–shifting interference microscopy for thickness–profile measurements of transparent thin – film layers on patterned substrates. Optics Express. 2006;14:4662 – 4667.
Bhaduri B, Mohan KN, Kothiyal MP, Sirohi RS. Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS). Optics Express. 2006;14:11598-11607.
2000
Ganesha U, Singaperumal M, Sirohi RS, Kothiyal MP. Characterization of surface topography by confocal microscopy: I. Principles and the measurement system. Journal of Measurement Science and Technology. 2000;11:305-314.
Ganesha U, Singaperumal M, Sirohi RS, Kothiyal MP. Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities. Journal of Measurement Science and Technology. 2000;11:315-329.
1998
Udupa G, Singaperumal M, Sirohi RS, Kothiyal MP. Assessment of surface geometry using confocal scanning optical microscope. Journal of Mechatronics. 1998;8:187-215.