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A comparative study of phase shifting algorithms in Digital Speckle Pattern Interferometry. Optik,. 2008;119:147-152..
Digital speckle pattern interferometry (DSPI) using spatial phase shifting: influence of intensity. J. Modern Optics. 2008;55:861-876..
Microscopic TV holography for MEMS deflection and surface profile. Optics and Lasers in Engineering. 2008;46:687-694..
(1,N) spatial phase shifting technique in DSPI and DS for NDE. Optical Engineering. 2007;46:051009-1-051009-7..
Curvature measurement using three-aperture digital shearography and fast Fourier transform method. Optics and Lasers in Engineering. 2007;45:1001-1014..
Design of a low power optical limiter based on a new nanocomposite material incorporating silica- encapsulated phthalocyanine in Nafion. Journal of Physics D. 2007;40:6121..
Digital speckle pattern interferometry (DSPI) with increased sensitivity: Use of spatial phase shifting. Optics Communication. 2007;272:9-14..
Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer. Applied Optics. 2007;46:5103-5109..
Photoacoustic investigation of aggregation effects in metal substituted tetra-phenylporphyrins. Material letters. 2007;61:4156..
Simple technique for obtaining photoacoustic spectra corrected for the spectral variation of the source in single scan. Review of Scintific Instruments. 2007;78:043102..
Simultaneous measurement of out-of-plane displacement and slope using multi-aperture DSPI system and fast Fourier transform. Applied Optics. 2007;46:5880-5886..
Spectrally resolved phase-shifting interferometry of transparent thin-films: sensitivity of thicknes measurements. Applied Optics. 2006;45:8636–8640..
Spectrally resolved white–light phase–shifting interference microscopy for thickness–profile measurements of transparent thin – film layers on patterned substrates. Optics Express. 2006;14:4662 – 4667..
Use of spatial phase shifting technique in digital speckle pattern interferometry (DSPI) and digital shearography (DS). Optics Express. 2006;14:11598-11607..
Characterization of surface topography by confocal microscopy: I. Principles and the measurement system. Journal of Measurement Science and Technology. 2000;11:305-314..
Characterization of surface topography by confocal microscopy: II. The micro and macro surface irregularities. Journal of Measurement Science and Technology. 2000;11:315-329..
Assessment of surface geometry using confocal scanning optical microscope. Journal of Mechatronics. 1998;8:187-215..