Publications

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2006
Debnath SK, Kothiyal MP, Schmit J, Hariharan P. Spectrally resolved phase-shifting interferometry of transparent thin-films: sensitivity of thicknes measurements. Applied Optics. 2006;45:8636–8640.
Debnath SK, Kothiyal MP, Schmit J, Hariharan P. Spectrally resolved white–light phase–shifting interference microscopy for thickness–profile measurements of transparent thin – film layers on patterned substrates. Optics Express. 2006;14:4662 – 4667.